Scanning Electron Microscope (PC-SEM)

Jeol JSM-6490 Bruker XFlash Detektor

Type: Jeol JSM-6490
Jeol JSM-6490 Scanning Electron Microscope (PC-SEM)
Modern, high-resolution, digital scanning electron microscope featuring newly developed electron optics and an intuitive, graphical user interface (GUI) running on Microsoft Windows XP Professional.
Bedpfx Ajmn Rcqef Dowg

Instrument configuration includes the following features:
• Magnification range: 5x – 300,000x
• Acceleration voltage: 0.3 – 30 kV
• Tungsten filament cathode (LaB6 cathode optional)
• Large fully motorized sample stage with eccentric tilt capability, including:
– Graphic navigation on the sample holder
– Easy sample navigation via click-center-zoom
– Field-of-view controlled navigation via two navigators
– Relative coordinate navigation
– Save and recall of sample positions
– Adjustable stage field-of-view selection
• Field-of-view correction during rotation via computer-driven eccentric rotation
• Field-of-view correction during tilting via computer-driven eccentric tilting
• Calculation of the possible tilt angle based on sample geometry
• Automatic focus tracking when moving the sample in the Z-axis
• Intelligent limit switches for all motorized axes
• Stage travel:
X = 125 mm
Y = 100 mm
Z = 5 to 80 mm (stepless)
T = -10°C to +90°C
R = 360° (continuous)
• Secondary electron detector for high vacuum operation
• Newly designed, super-conical objective lens for optimal resolution at high tilt angles
• Guaranteed SE image resolution: 3 nm at 30 kV and 15 nm at 1 kV
• Simultaneous live imaging with multiple detectors
• Powerful image measurement functions
• Movie function for recording dynamic processes
• Versatile specimen chamber with numerous expansion options: free ports for EDX, WDX, EBSD, cathodoluminescence, etc.
• Low-maintenance, quiet pump system consisting of a fore vacuum pump, vibration-free high-performance diffusion pump, and electromagnetic valve control
• Comprehensive safety procedures against misuse and external media failure
• Ergonomic, height-adjustable system table
• SEM starter kit including 2 sample holders, tool kit, and 6 replacement filaments

Additional equipment for SEM:
• Turbomolecular pump (instead of standard diffusion pump)
– Use of a turbomolecular pump eliminates the need for cooling water during SEM operation.

Further SEM equipment:
• PC for SEM control including TFT monitor
• ΟΧ200 Bruker Quantax 200 Extended EDX System
– Bruker EDX software will be transferred to new owner upon purchase
• Nitrogen-free, energy-dispersive X-ray analysis system including:
– SDD detector with 127 eV energy resolution or better
– Detection for all elements from boron upwards
– Vibration-free, maintenance-free. Peltier cooled (no nitrogen required)
– Pulse processor
– TFT monitor
– Spectrum measurement and element identification
– Fully automatic, quantitative, standardless elemental analysis
– Image acquisition
– Ultra-fast qualitative line scan
– Ultra-fast qualitative element mapping
– Data management and archiving system
– Report generation and results output
– Data communication
– Installation and user training
– HyperMap
– Multipoint analysis
– Bruker xFlash detector (SDD) with signal processing unit SVE III

Scope of delivery: (see photos)
Condition: used
(Subject to changes and errors in the technical data and specifications!)

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