Measuring system

Leica EM TXP

The EM TXP is a unique device developed for the precise preparation of a wide range of materials and material combinations exhibiting localized, minimal defects. It is specially designed for sawing, milling, grinding, and polishing demanding, small, and unwieldy specimens, where the work process is observed with a stereomicroscope and final inspection is conducted using a scanning electron microscope or light microscope without interrupting the individual steps.

The EM TXP is particularly well-suited for pre-preparing materials that will undergo bevel cutting with an ion polishing system.
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Included accessories:
- 1x Complete M80 stereomicroscope
- 1x Crosshair stage for M80, 12 mm
- 1x Movable objective adapter for M80
- 1x Angle adjustment adapter
- 1x Diamond saw blade
- 1x Diamond saw blade
- 1x Special milling cutter, 6 mm Ø diamond edge
- 1x Special milling cutter, 12 mm Ø diamond edge
- 1x Special milling cutter, 8 mm Ø WC cutter
- 1x Special milling cutter, 12 mm Ø WC cutter
- 5x Arbor
- 3x Carrier for lapping film
- 1x Lapping film, 15µm, SiC, 30 mm Ø
- 1x Lapping film, 9µm, SiC, 30 mm Ø
- 1x Lapping film, 5µm, SiC, 30 mm Ø
- 3x Carrier for lapping film
- 1x Lapping film, 9µm, diamond (Type U)
- 1x Lapping film, 2µm, diamond (Type U)
- 1x Lapping film, 0.5µm, diamond (Type U)
- 1x Lapping film, 0.1µm, diamond (Type LA)
- 3x Carrier for lapping film
- 1x Lapping film, 9µm, aluminum oxide
- 1x Lapping film, 3µm, aluminum oxide
- 1x Lapping film, 1µm, aluminum oxide
- 1x Lapping film, 0.3µm, aluminum oxide
- 1x Neoprene cloth for final polishing (8 pcs)
- 2x Box for carriers and films
- 1x Holder for flat samples, 0-4 mm
- 1x Flat specimen holder, 3-8 mm
- 1x TXP SEM stub holder
- 1x Universal sample holder

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